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2010, ISBN: 9781441909282
eBooks, eBook Download (PDF), 2010, Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate… mais…
ISBN: 9781441909282
*Power-Aware Testing and Test Strategies for Low Power Devices* / pdf eBook für 106.99 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Computer & Internet Medien > Bücher nein eBook a… mais…
ISBN: 9781441909282
; PDF; Scientific, Technical and Medical > Electronics & communications engineering > Electronics engineeri, Cambridge Scholars Publishing
2010, ISBN: 9781441909282
eBooks, eBook Download (PDF), 2010, [PU: Springer US], Springer US, 2010
2010, ISBN: 9781441909282
2010, eBook Download (PDF), eBooks, [PU: Springer US]
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Dados detalhados do livro - Power-Aware Testing and Test Strategies for Low Power Devices
EAN (ISBN-13): 9781441909282
ISBN (ISBN-10): 1441909281
Ano de publicação: 2010
Editor/Editora: Springer-Verlag GmbH
353 Páginas
Língua: eng/Englisch
Livro na base de dados desde 2011-10-05T19:05:02+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2023-06-15T08:53:26+01:00 (Lisbon)
Número ISBN/EAN: 1441909281
Número ISBN - Ortografia alternativa:
1-4419-0928-1, 978-1-4419-0928-2
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: girard patrick, xiaoqi
Título do livro: test
Dados da editora
Autor: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Título: Power-Aware Testing and Test Strategies for Low Power Devices
Editora: Springer; Springer US
363 Páginas
Ano de publicação: 2010-03-11
New York; NY; US
Impresso / Feito em
Língua: Inglês
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XXI, 363 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; B; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BB
Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.Outros livros adicionais, que poderiam ser muito similares com este livro:
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