2010, ISBN: 144190929X, Lieferbar binnen 4-6 Wochen Custos de envio:Versandkostenfrei innerhalb der BRD

Internationaler Buchtitel. In englischer Sprache. Verlag: SPRINGER VERLAG GMBH, 388 Seiten, L=156mm, B=234mm, H=20mm, Gew.=540gr, [GR: 26830 - TB/Maschinenbau/Fertigungstechnik], [SW: - … mais…

Internationaler Buchtitel. In englischer Sprache. Verlag: SPRINGER VERLAG GMBH, 388 Seiten, L=156mm, B=234mm, H=20mm, Gew.=540gr, [GR: 26830 - TB/Maschinenbau/Fertigungstechnik], [SW: - Technology & Industrial Arts], Kartoniert/Broschiert, Klappentext: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.<