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Applied Scanning Probe Methods XI : Scanning Probe Microscopy Techniques - Harald Fuchs
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Harald Fuchs:

Applied Scanning Probe Methods XI : Scanning Probe Microscopy Techniques - Livro de bolso

2010, ISBN: 364209869X

[EAN: 9783642098697], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], AFM; REM; CERAMICS; POLYMER; SPECTROSCOPY; ULTRASOUND, Druck auf Anfrage Neuware - Printed after ordering - The… mais…

NEW BOOK. Custos de envio:Versandkostenfrei. (EUR 0.00) AHA-BUCH GmbH, Einbeck, Germany [51283250] [Rating: 5 (von 5)]
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Applied Scanning Probe Methods XI : Scanning Probe Microscopy Techniques - Harald Fuchs
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Harald Fuchs:

Applied Scanning Probe Methods XI : Scanning Probe Microscopy Techniques - Livro de bolso

2010, ISBN: 364209869X

[EAN: 9783642098697], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], AFM; REM; CERAMICS; POLYMER; SPECTROSCOPY; ULTRASOUND, Druck auf Anfrage Neuware -The ability to accurately and… mais…

NEW BOOK. Custos de envio:Versandkostenfrei. (EUR 0.00) AHA-BUCH GmbH, Einbeck, Germany [51283250] [Rating: 5 (von 5)]
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Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques - Fuchs, Harald (Herausgeber); Bhushan, Bharat (Herausgeber)
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Fuchs, Harald (Herausgeber); Bhushan, Bharat (Herausgeber):
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques - Livro de bolso

2010

ISBN: 364209869X

Edição encadernada

Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Wissenschaftliche Ausstattung, Experimente und Techniken, Spektroskopie, Spektrochemie, Massenspektrometrie, Polymerc… mais…

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Applied Scanning Probe Methods XI - Bhushan, Bharat Fuchs, Harald
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Bhushan, Bharat Fuchs, Harald:
Applied Scanning Probe Methods XI - primeira edição

2010, ISBN: 9783642098697

Livro de bolso

[ED: Kartoniert / Broschiert], [PU: Springer Berlin Heidelberg], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing th… mais…

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Applied Scanning Probe Methods XI
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Applied Scanning Probe Methods XI - novo libro

ISBN: 9783642098697

There is currently no description available, Springer

Nr. 978-3-642-09869-7. Custos de envio:Worldwide free shipping, , DE. (EUR 0.00)

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Applied Scanning Probe Methods XI

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Dados detalhados do livro - Applied Scanning Probe Methods XI


EAN (ISBN-13): 9783642098697
ISBN (ISBN-10): 364209869X
Livro de capa dura
Livro de bolso
Ano de publicação: 2010
Editor/Editora: Springer Berlin
292 Páginas
Peso: 0,445 kg
Língua: eng/Englisch

Livro na base de dados desde 2011-04-27T15:47:34+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2024-01-28T11:58:05+00:00 (Lisbon)
Número ISBN/EAN: 364209869X

Número ISBN - Ortografia alternativa:
3-642-09869-X, 978-3-642-09869-7
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: bhushan, harald fuchs
Título do livro: scanning probe microscopy nanoscience, applied methods, probe aufnahmen


Dados da editora

Autor: Bharat Bhushan
Título: NanoScience and Technology; Applied Scanning Probe Methods XI - Scanning Probe Microscopy Techniques
Editora: Springer; Springer Berlin
236 Páginas
Ano de publicação: 2010-11-16
Berlin; Heidelberg; DE
Impresso / Feito em
Peso: 0,450 kg
Língua: Inglês
120,99 € (DE)

BC; Nanotechnology and Microengineering; Hardcover, Softcover / Technik/Sonstiges; Elektronik; Verstehen; AFM; REM; ceramics; microscopy; polymer; spectroscopy; ultrasound; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Microsystems and MEMS; Spectroscopy; Surface and Interface and Thin Film; Nanotechnology; Surfaces, Interfaces and Thin Film; Polymers; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Nanotechnologie; Materialwissenschaft; Technische Anwendung von Polymeren und Verbundwerkstoffen; BB

Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.

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