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Noncontact Atomic Force Microscopy | Volume 3 | Seizo Morita (u. a.) | Buch | NanoScience and Technology | HC runder Rücken kaschiert | Englisch | 2015 | Springer International Publishing - Morita, Seizo
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Morita, Seizo:

Noncontact Atomic Force Microscopy | Volume 3 | Seizo Morita (u. a.) | Buch | NanoScience and Technology | HC runder Rücken kaschiert | Englisch | 2015 | Springer International Publishing - encadernado, livro de bolso

2015, ISBN: 9783319155876

[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… mais…

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Noncontact Atomic Force Microscopy - Seizo Morita
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Noncontact Atomic Force Microscopy - Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
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Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger:
Noncontact Atomic Force Microscopy - encadernado, livro de bolso

2015

ISBN: 9783319155876

Volume 3, Buch, Hardcover, 2015, This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that … mais…

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Noncontact Atomic Force Microscopy / Volume 3 / Seizo Morita (u. a.) / Buch / NanoScience and Technology / HC runder Rücken kaschiert / Englisch / 2015 / Springer International Publishing - Morita, Seizo
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Morita, Seizo:
Noncontact Atomic Force Microscopy / Volume 3 / Seizo Morita (u. a.) / Buch / NanoScience and Technology / HC runder Rücken kaschiert / Englisch / 2015 / Springer International Publishing - encadernado, livro de bolso

2015, ISBN: 9783319155876

[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… mais…

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Noncontact Atomic Force Microscopy Volume 3 - Morita, Seizo (Herausgeber); Wiesendanger, Roland (Herausgeber); Meyer, Ernst (Herausgeber); Giessibl, Franz J. (Herausgeber)
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Morita, Seizo (Herausgeber); Wiesendanger, Roland (Herausgeber); Meyer, Ernst (Herausgeber); Giessibl, Franz J. (Herausgeber):
Noncontact Atomic Force Microscopy Volume 3 - encadernado, livro de bolso

2015, ISBN: 3319155873

2015 Gebundene Ausgabe Mikroskopie, Nanotechnologie, Technologie / Nanotechnologie, Spektroskopie, Nanowissenschaften, Spektroskopie, Spektrochemie, Massenspektrometrie, Materialwissens… mais…

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Noncontact Atomic Force Microscopy
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9783319155876


This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Dados detalhados do livro - Noncontact Atomic Force Microscopy


EAN (ISBN-13): 9783319155876
ISBN (ISBN-10): 3319155873
Livro de capa dura
Ano de publicação: 2009
Editor/Editora: Springer International Publishing

Livro na base de dados desde 2015-08-07T13:52:55+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2023-04-11T16:48:58+01:00 (Lisbon)
Número ISBN/EAN: 9783319155876

Número ISBN - Ortografia alternativa:
3-319-15587-3, 978-3-319-15587-6
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: ernst meyer, gies, ernst wies, roland wiesendanger, meyer franz, morita
Título do livro: force, atomic, morita, international volume

Dados da editora

Autor: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
Título: NanoScience and Technology; Noncontact Atomic Force Microscopy - Volume 3
Editora: Springer; Springer International Publishing
527 Páginas
Ano de publicação: 2015-06-02
Cham; CH
Impresso / Feito em
Língua: Inglês
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
POD
XXII, 527 p. 256 illus., 159 illus. in color.

BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Atom Manipulation; Atomic Force Microscopy; Atomic Resolution; Atomic/Molecular Manipulation; Chemical Structure; Force Mapping with Atomic Resolution; Liquid AFM; Magnetic Exchange Force Microscopy; Scanning Probe Techniques; Scanning Tunneling Microscopy; Nanophysics; Surfaces, Interfaces and Thin Film; Spectroscopy; Nanotechnology; Nanowissenschaften; Materialwissenschaft; Spektroskopie, Spektrochemie, Massenspektrometrie; Nanotechnologie; EA; BC

From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.
Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy Deals with the various classes of materials studied at the atomic scale A valuable reference for researchers as well as a text for graduate students Written by leading researchers in the field Includes supplementary material: sn.pub/extras
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