Rough Sets and Knowledge Technology 10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings - novo libro
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Rough Sets and Knowledge Technology 10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings - novo libro
2015, ISBN: 3319257536
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Rough Sets and Knowledge Technology 10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings - novo libro
2015, ISBN: 3319257536
1st ed. 2015 Kartoniert / Broschiert Intelligenz / Künstliche Intelligenz, KI, Künstliche Intelligenz - AI, Datenbanken, Data Mining, Angewandte Informatik, Künstliche Intelligenz, Wiss… mais…
Ciucci, Davide (Herausgeber); Wu, Wei-Zhi (Herausgeber); Mitra, Sushmita (Herausgeber); Wang, Guoyin (Herausgeber):
Rough Sets and Knowledge Technology 10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings - novo libro2015, ISBN: 3319257536
1st ed. 2015 Kartoniert / Broschiert Intelligenz / Künstliche Intelligenz, KI, Künstliche Intelligenz - AI, Datenbanken, Data Mining, Angewandte Informatik, Künstliche Intelligenz, Wiss… mais…
2015
ISBN: 3319257536
This book constitutes the thoroughly refereed conference proceedings of the 10th International Conference on Rough Sets and Knowledge Technology, RSKT 2015, held in Tianjin, China, in Nov… mais…
2015, ISBN: 3319257536
[EAN: 9783319257532], Neubuch, [PU: Springer International Publishing], INTELLIGENZ KüNSTLICHE KI - AI COMPUTERVISION DATAMINING DISTRIBUTEDCOMPUTINGMETHODOLOGIES ENSEMBLEMETHODS MACHINE… mais…
2015, ISBN: 9783319257532
10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings, Buch, Softcover,… mais…
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Dados detalhados do livro - Rough Sets and Knowledge Technology
EAN (ISBN-13): 9783319257532
ISBN (ISBN-10): 3319257536
Livro de capa dura
Livro de bolso
Ano de publicação: 2015
Editor/Editora: Springer International Publishing
Livro na base de dados desde 2015-09-29T23:33:18+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2023-12-07T16:06:22+00:00 (Lisbon)
Número ISBN/EAN: 9783319257532
Número ISBN - Ortografia alternativa:
3-319-25753-6, 978-3-319-25753-2
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: wei wang, mitra, wang david
Título do livro: wei, tianjin china
Dados da editora
Autor: Davide Ciucci; Guoyin Wang; Sushmita Mitra; Wei-Zhi Wu
Título: Lecture Notes in Computer Science; Lecture Notes in Artificial Intelligence; Rough Sets and Knowledge Technology - 10th International Conference, RSKT 2015, Held as Part of the International Joint Conference on Rough Sets, IJCRS 2015, Tianjin, China, November 20-23, 2015, Proceedings
Editora: Springer; Springer International Publishing
538 Páginas
Ano de publicação: 2015-11-22
Cham; CH
Impresso / Feito em
Língua: Inglês
53,49 € (DE)
54,99 € (AT)
59,00 CHF (CH)
POD
XVI, 538 p. 156 illus., 42 illus. in color.
BC; Hardcover, Softcover / Informatik, EDV/Informatik; Künstliche Intelligenz; Verstehen; Computer vision; Data mining; Distributed computing methodologies; Ensemble methods; Machine learning; Approximation; Artificial intelligence; Big data; Cluster analysis; Decision systems; Granular computing; Information retrieval; Knowledge representation and reasoning; Neural networks; Pattern recognition; Recommender system; Rough sets; Rule learning; Three-way decisions; Uncertainty measures; Artificial Intelligence; Computer and Information Systems Applications; Database Management; Numerical Analysis; Data Mining and Knowledge Discovery; Automated Pattern Recognition; Angewandte Informatik; Datenbanken; Numerische Mathematik; Data Mining; Wissensbasierte Systeme, Expertensysteme; Mustererkennung; EA
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