ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… mais…
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2012, ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… mais…
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ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… mais…
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2013, ISBN: 9783642297618
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2013, ISBN: 9783642297618
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ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… mais…
Brent Fultz#James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - novo libro2012, ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… mais…
ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… mais…
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), Auflage, [PU: Springer Lehrbuch], [ED: 4], Springer Lehrbuch, 2013
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013
Dados bibliográficos do melhor livro correspondente
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Dados detalhados do livro - Transmission Electron Microscopy and Diffractometry of Materials
EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Ano de publicação: 2012
Editor/Editora: Springer Lehrbuch
761 Páginas
Língua: eng/Englisch
Livro na base de dados desde 2012-11-07T07:35:01+00:00 (Lisbon)
Página de detalhes modificada pela última vez em 2023-01-10T22:14:26+00:00 (Lisbon)
Número ISBN/EAN: 9783642297618
Número ISBN - Ortografia alternativa:
3-642-29761-7, 978-3-642-29761-8
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: james, howe, jam, brent, fultz
Título do livro: electron microscopy materials, material, electro, transmission
Dados da editora
Autor: Brent Fultz; James Howe
Título: Graduate Texts in Physics; Transmission Electron Microscopy and Diffractometry of Materials
Editora: Springer; Springer Berlin
764 Páginas
Ano de publicação: 2012-10-13
Berlin; Heidelberg; DE
Língua: Inglês
90,94 € (DE)
93,50 € (AT)
100,50 CHF (CH)
Available
XX, 764 p.
EA; E107; eBook; Nonbooks, PBS / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry; B; Spectroscopy; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Surface and Interface and Thin Film; Physics and Astronomy; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC
Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.
James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras
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