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ISBN: 9789814273329
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Electromigration In Ulsi Interconnections (International Series on Advances in Solid State Electronics and Technology, Band 0) - encadernado, livro de bolso
2010, ISBN: 9789814273329
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2010, ISBN: 9814273325
Gebundene Ausgabe TECHNOLOGY & ENGINEERING / Electronics / Semiconductors, mit Schutzumschlag 11, [PU:World Scientific Publishing Company]
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2025, ISBN: 9789814273329
[ED: Buch], [PU: World Scientific Publishing Company], Neuware - Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circu… mais…
ISBN: 9789814273329
Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on ele… mais…
Electromigration In Ulsi Interconnections (International Series on Advances in Solid State Electronics and Technology, Band 0) - encadernado, livro de bolso
2010
ISBN: 9789814273329
Wspc, Gebundene Ausgabe, Auflage: Illustrated, 312 Seiten, Publiziert: 2010-06-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: NUSTBK20171230-C0025961, 1.3 kg, Elektrotechnik, Ingenieu… mais…
ISBN: 9789814273329
Fnac.com : Electromigration in Ulsi Interconnections, International Series on Advances in Solid State Electronics and Technology - Livre. Découvrez des nouveautés, des coups de cœur, des… mais…
2010, ISBN: 9814273325
Gebundene Ausgabe TECHNOLOGY & ENGINEERING / Electronics / Semiconductors, mit Schutzumschlag 11, [PU:World Scientific Publishing Company]
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Dados detalhados do livro - Electromigration in Ulsi Interconnections by Cher Ming Tan Hardcover | Indigo Chapters
EAN (ISBN-13): 9789814273329
ISBN (ISBN-10): 9814273325
Livro de capa dura
Ano de publicação: 2010
Editor/Editora: Cher Ming Tan
291 Páginas
Peso: 0,570 kg
Língua: eng/Englisch
Livro na base de dados desde 2012-01-13T17:40:48+00:00 (Lisbon)
Página de detalhes modificada pela última vez em 2023-12-08T00:30:13+00:00 (Lisbon)
Número ISBN/EAN: 9814273325
Número ISBN - Ortografia alternativa:
981-4273-32-5, 978-981-4273-32-9
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: tan, ming, cher
Título do livro: international electronic, solid state, ulsi technology
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