2005, ISBN: 9783540226802
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CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms - encadernado, livro de bolso
2005, ISBN: 354022680X
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2005, ISBN: 9783540226802
[ED: Hardcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and… mais…
2001, ISBN: 9783540226802
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are… mais…
2001
ISBN: 9783540226802
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are… mais…
2001, ISBN: 9783540226802
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are… mais…
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms - encadernado, livro de bolso
2005, ISBN: 354022680X
2005 Gebundene Ausgabe Mikrotechnologie - Mikrotechnik, Technologie / Mikrotechnologie, Sensor - Sensorik, Ingenieurwissenschaft - Ingenieurwissenschaftler, Maschinenbau, Materialwissen… mais…
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Número ISBN: |
Dados detalhados do livro - CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)
EAN (ISBN-13): 9783540226802
ISBN (ISBN-10): 354022680X
Livro de capa dura
Livro de bolso
Ano de publicação: 2002
Editor/Editora: Springer-Verlag GmbH
Livro na base de dados desde 2007-05-22T10:58:04+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2022-08-05T17:33:25+01:00 (Lisbon)
Número ISBN/EAN: 354022680X
Número ISBN - Ortografia alternativa:
3-540-22680-X, 978-3-540-22680-2
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: flora
Título do livro: mems, sensor, flora heidelberg, ccd, into the deep, deep value, damage, degradation, ultraviolet
Dados da editora
Autor: Flora Li; Arokia Nathan
Título: Microtechnology and MEMS; CCD Image Sensors in Deep-Ultraviolet - Degradation Behavior and Damage Mechanisms
Editora: Springer; Springer Berlin
232 Páginas
Ano de publicação: 2005-03-01
Berlin; Heidelberg; DE
Língua: Inglês
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
Available
XII, 232 p. 84 illus.
BB; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Verstehen; Ingenieurwissenschaften; Physik; CCD image sensor; Deep-UV damage mechanisms; Eximer laser; Photodiode; Sensor; UV photodiodes; design; imaging; integrated circuit; laser; optimization; semiconductor; technology; Optical Materials; Laser; Technology and Engineering; Electronics and Microelectronics, Instrumentation; Laserphysik; Ingenieurswesen, Maschinenbau allgemein; Elektronik; EA; BC
Overview of CCD.- CCD Imaging in the Ultraviolet (UV) Regime.- Silicon.- Silicon Dioxide.- Si-SiO2 Interface.- General Effects of Radiation.- Effects of Radiation on CCDs.- UV-Induced Effects in Si.- UV Laser Induced Effects in SiO2.- UV Laser Induced Effects at the Si-SiO2 Interface.- CCD Measurements at 157nm.- Design Optimizations for Future Research.- Concluding Remarks.The first book to integrate CCD image sensor characteristics, their intrinsic instabilities, and the effect of UV radiation on device characteristics
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