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Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - David B. Williams, C. Barry Carter
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David B. Williams, C. Barry Carter:

Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - Livro de bolso

ISBN: 030645324X

[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… mais…

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Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - David B. Williams, C. Barry Carter
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David B. Williams, C. Barry Carter:

Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - Livro de bolso

ISBN: 030645324X

[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… mais…

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Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - David B. Williams, C. Barry Carter
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Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - Livro de bolso

ISBN: 9780306453243

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Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - David B. Williams
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Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - Livro de bolso

2004, ISBN: 030645324X

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Transmission Electron Microscopy - Carter C. Barry Williams David B.
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Carter C. Barry Williams David B.:
Transmission Electron Microscopy - Livro de bolso

2004, ISBN: 030645324X

[EAN: 9780306453243], [PU: Springer], pp. 703, Books

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Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV
Autor:
Título:
Número ISBN:

9780306453243


This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Dados detalhados do livro - Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV


EAN (ISBN-13): 9780306453243
ISBN (ISBN-10): 030645324X
Livro de bolso
Ano de publicação: 1996
Editor/Editora: Springer
703 Páginas
Peso: 1,964 kg
Língua: eng/Englisch

Livro na base de dados desde 2007-04-24T00:18:06+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2023-07-04T08:15:08+01:00 (Lisbon)
Número ISBN/EAN: 9780306453243

Número ISBN - Ortografia alternativa:
0-306-45324-X, 978-0-306-45324-3
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: david carter, carter william, carter barry, williams and carter
Título do livro: transmission electron microscopy textbook for materials science

Dados da editora

Autor: David B. Williams; C. Barry Carter
Título: Transmission Electron Microscopy - A Textbook for Materials Science
Editora: Springer; Springer US
729 Páginas
Ano de publicação: 2004-08-31
New York; NY; US
Impresso / Feito em
Peso: 1,840 kg
Língua: Inglês
85,59 € (DE)
87,99 € (AT)
106,60 CHF (CH)
Not available, publisher indicates OP

BC; Book; Hardcover, Softcover / Physik, Astronomie/Mechanik, Akustik; Spektroskopie, Spektrochemie, Massenspektrometrie; electron microscope; electron microscopy; diffraction; crystal; microscopy; transmission electron microscopy; Helium-Atom-Streuung; materials characterization; B; Physics and Astronomy; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Solid State Physics; Characterization and Evaluation of Materials; Biological Microscopy; Wissenschaftliche Ausstattung, Experimente und Techniken; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; Werkstoffprüfung; Biologie, Biowissenschaften; Wissenschaftliche Ausstattung, Experimente und Techniken; BB; BC

Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to `See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.
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