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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:

Power-Aware Testing and Test Strategies for Low Power Devices - novo libro

2001, ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… mais…

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Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - Girard, Patrick
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Girard, Patrick:

Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - encadernado, livro de bolso

2009, ISBN: 9781441909275

[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … mais…

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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard#Nicola Nicolici#Xiaoqing Wen
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Patrick Girard#Nicola Nicolici#Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - encadernado, livro de bolso

2009

ISBN: 9781441909275

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such a… mais…

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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:
Power-Aware Testing and Test Strategies for Low Power Devices - novo libro

2001, ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… mais…

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Power-Aware Testing and Test Strategies for Low Power Devices - Girard, Patrick, Nicola Nicolici und Xiaoqing Wen
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Girard, Patrick, Nicola Nicolici und Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - primeira edição

2009, ISBN: 9781441909275

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Power-Aware Testing and Test Strategies for Low Power Devices
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9781441909275


Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Dados detalhados do livro - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Livro de capa dura
Ano de publicação: 2009
Editor/Editora: Springer-Verlag New York Inc.
363 Páginas
Peso: 0,717 kg
Língua: eng/Englisch

Livro na base de dados desde 2009-11-13T19:04:16+00:00 (Lisbon)
Página de detalhes modificada pela última vez em 2023-11-10T16:15:21+00:00 (Lisbon)
Número ISBN/EAN: 9781441909275

Número ISBN - Ortografia alternativa:
1-4419-0927-3, 978-1-4419-0927-5
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: girard patrick, xiaoqi
Título do livro: test, the power now

Dados da editora

Autor: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Título: Power-Aware Testing and Test Strategies for Low Power Devices
Editora: Springer; Springer US
363 Páginas
Ano de publicação: 2009-11-23
New York; NY; US
Impresso / Feito em
Língua: Inglês
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXI, 363 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC

Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.
Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras
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