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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45) - Reimer, Ludwig
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Reimer, Ludwig:

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45) - Livro de bolso

2010, ISBN: 9783642083723

Editor: Hawkes, P.W. Springer, Paperback, Auflage: Softcover reprint of the original 2nd ed. 1998, 543 Seiten, Publiziert: 2010-12-01T00:00:01Z, Produktgruppe: Book, Hersteller-Nr.: biogr… mais…

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Scanning Electron Microscopy Physics of Image Formation and Microanalysis - Reimer, Ludwig
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Reimer, Ludwig:

Scanning Electron Microscopy Physics of Image Formation and Microanalysis - Livro de bolso

2010, ISBN: 3642083722

Softcover reprint of the original 2nd ed. 1998 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Rasterelektronenmikroskopie; scanningtunnelingcrystal; diffract… mais…

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Scanning Electron Microscopy - Ludwig Reimer
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Ludwig Reimer:
Scanning Electron Microscopy - Livro de bolso

ISBN: 9783642083723

Scanning Electron Microscopy ab 192.49 € als Taschenbuch: Physics of Image Formation and Microanalysis. Softcover reprint of the original 2nd ed. 1998. Aus dem Bereich: Bücher, Wissenscha… mais…

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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) [Soft Cover ] - Reimer, Ludwig
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Reimer, Ludwig:
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) [Soft Cover ] - Livro de bolso

2010, ISBN: 3642083722

[EAN: 9783642083723], Neubuch, [PU: Springer], Books

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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis - Reimer, Ludwig
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Reimer, Ludwig:
Scanning Electron Microscopy : Physics of Image Formation and Microanalysis - Livro de bolso

2010, ISBN: 3642083722

[EAN: 9783642083723], Gebraucht, wie neu, [PU: Springer], Unread book in perfect condition., Books

NOT NEW BOOK. Custos de envio: EUR 17.42 GreatBookPricesUK, Castle Donington, DERBY, United Kingdom [72536976] [Rating: 4 (von 5)]
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Scanning Electron Microscopy
Autor:
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Número ISBN:

9783642083723


Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Dados detalhados do livro - Scanning Electron Microscopy


EAN (ISBN-13): 9783642083723
ISBN (ISBN-10): 3642083722
Livro de capa dura
Livro de bolso
Ano de publicação: 2010
Editor/Editora: Springer Berlin Heidelberg

Livro na base de dados desde 2011-08-01T17:50:49+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2024-01-11T20:31:36+00:00 (Lisbon)
Número ISBN/EAN: 9783642083723

Número ISBN - Ortografia alternativa:
3-642-08372-2, 978-3-642-08372-3
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: ludwig reimer, hawkes, ludwig reimers
Título do livro: optical microscopy, science microscopy, scanning electron microscopy physics image formation and microanalysis, ludwig

Dados da editora

Autor: Ludwig Reimer
Título: Springer Series in Optical Sciences; Scanning Electron Microscopy - Physics of Image Formation and Microanalysis
Editora: Springer; Springer Berlin
529 Páginas
Ano de publicação: 2010-12-01
Berlin; Heidelberg; DE
Impresso / Feito em
Língua: Inglês
329,99 € (DE)

BC; Hardcover, Softcover / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Rasterelektronen Mikroskopie; Scanning Tunneling Microscopy; crystal; diffraction; electron microscope; electron microscopy; electron optics; microscopy; optics; scanning electron microscope; Spectroscopy; Condensed Matter Physics; Surface and Interface and Thin Film; Physics and Astronomy; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Mathematik und Naturwissenschaften; BB; BB; EA

provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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