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In-situ Materials Characterization : Across Spatial and Temporal Scales - Livro de bolso2016, ISBN: 3662519763
[EAN: 9783662519769], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], IN-SITUCHARACTERIZATION; MATERIALDYNAMICS; NANOANALYSIS; NANOSCALEMATERIALS; NEUTRONSCATTERING; PHOTOELECTRONSP… mais…
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2016, ISBN: 9783662519769
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Dados detalhados do livro - In-situ Materials Characterization
EAN (ISBN-13): 9783662519769
ISBN (ISBN-10): 3662519763
Livro de capa dura
Livro de bolso
Ano de publicação: 2016
Editor/Editora: Springer Berlin
Livro na base de dados desde 2016-09-10T13:43:34+01:00 (Lisbon)
Página de detalhes modificada pela última vez em 2024-03-22T19:59:29+00:00 (Lisbon)
Número ISBN/EAN: 9783662519769
Número ISBN - Ortografia alternativa:
3-662-51976-3, 978-3-662-51976-9
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: alexander ziegler, graaf, zhang xiao, zhang feng, joost, alexander heinz
Título do livro: characterization materials, scales, situ
Dados da editora
Autor: Alexander Ziegler; Heinz Graafsma; Xiao Feng Zhang; Joost W.M. Frenken
Título: Springer Series in Materials Science; In-situ Materials Characterization - Across Spatial and Temporal Scales
Editora: Springer; Springer Berlin
256 Páginas
Ano de publicação: 2016-08-23
Berlin; Heidelberg; DE
Impresso / Feito em
Língua: Inglês
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XI, 256 p. 124 illus., 78 illus. in color.
BC; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; In-situ characterization; Material dynamics; Nanoanalysis; Nanoscale materials; Neutron scattering; Photoelectron spectroscopy; Scanning probe techniques; Structure-property; Ultra-fast analysis; X-ray absorption spectroscopy; Nanophysics; Characterization and Analytical Technique; Spectroscopy; Surfaces, Interfaces and Thin Film; Nanotechnology; Structural Materials; Nanowissenschaften; Werkstoffprüfung; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; Nanotechnologie; BB
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.Scientific status report on analytical techniques in nano-and surface sciences Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering Includes supplementary material: sn.pub/extras
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